{"id":47819,"date":"2025-09-05T07:58:47","date_gmt":"2025-09-05T14:58:47","guid":{"rendered":"https:\/\/www.cohu.com\/?p=47819"},"modified":"2025-09-24T09:36:23","modified_gmt":"2025-09-24T16:36:23","slug":"using-ai-for-fault-detection-and-classification-in-semiconductor-manufacturing","status":"publish","type":"post","link":"https:\/\/www.cohu.com\/tignis\/using-ai-for-fault-detection-and-classification-in-semiconductor-manufacturing","title":{"rendered":"Using AI For Fault Detection And Classification In Semiconductor Manufacturing"},"content":{"rendered":"\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m8g28v5p-746d8baae8d89148fb421ccddfa3a141\">\n.avia-section.av-m8g28v5p-746d8baae8d89148fb421ccddfa3a141 .av-parallax .av-parallax-inner{\nbackground-repeat:no-repeat;\nbackground-image:url(\/wp-content\/uploads\/2025\/03\/resources-banner-1500x333.jpg);\nbackground-position:50% 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.av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .av-special-heading-tag{\nfont-size:40px;\n}\n.av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .special-heading-inner-border{\nborder-color:#ffffff;\n}\n.av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .av-subheading{\nfont-size:25px;\n}\n\n@media only screen and (min-width: 768px) and (max-width: 989px){ \n#top #wrap_all .av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .av-special-heading-tag{\nfont-size:50px;\n}\n.av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .av-subheading{\nfont-size:25px;\n}\n}\n\n@media only screen and (min-width: 480px) and (max-width: 767px){ \n#top #wrap_all .av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .av-special-heading-tag{\nfont-size:47px;\n}\n.av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .av-subheading{\nfont-size:20px;\n}\n}\n\n@media only screen and (max-width: 479px){ \n#top #wrap_all .av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .av-special-heading-tag{\nfont-size:33px;\n}\n.av-special-heading.av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a .av-subheading{\nfont-size:15px;\n}\n}\n<\/style>\n<div  class='av-special-heading av-m8g29ww6-eae5135b0895c3f76a92dcd7e248c63a av-special-heading-h1 custom-color-heading blockquote modern-quote  avia-builder-el-2  avia-builder-el-no-sibling  av-inherit-size av-linked-heading'><h1 class='av-special-heading-tag '  itemprop=\"headline\"  >PHYSICS, MACHINES AND DATA<\/h1><div class=\"special-heading-border\"><div class=\"special-heading-inner-border\"><\/div><\/div><\/div><\/div>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-ihh5rt-7c29a3ec1a8f6761bd43bebe8db0c191\">\n.flex_column.av-ihh5rt-7c29a3ec1a8f6761bd43bebe8db0c191{\nborder-radius:0px 0px 0px 0px;\npadding:0px 0px 0px 0px;\n}\n<\/style>\n<div  class='flex_column av-ihh5rt-7c29a3ec1a8f6761bd43bebe8db0c191 av_one_third  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src=\"\/wp-content\/uploads\/2025\/03\/Tignis-Logo-cohu-tagline-all-white-transparent-300x89.png\" alt='Tignis, A Cohu Analytics Solution logo in white' title='Tignis-Logo-cohu-tagline-all white-transparent'  height=\"89\" width=\"300\"  itemprop=\"thumbnailUrl\" srcset=\"\/wp-content\/uploads\/2025\/03\/Tignis-Logo-cohu-tagline-all-white-transparent-300x89.png 300w, \/wp-content\/uploads\/2025\/03\/Tignis-Logo-cohu-tagline-all-white-transparent-1030x305.png 1030w, \/wp-content\/uploads\/2025\/03\/Tignis-Logo-cohu-tagline-all-white-transparent-768x228.png 768w, \/wp-content\/uploads\/2025\/03\/Tignis-Logo-cohu-tagline-all-white-transparent-1536x455.png 1536w, \/wp-content\/uploads\/2025\/03\/Tignis-Logo-cohu-tagline-all-white-transparent-2048x607.png 2048w, \/wp-content\/uploads\/2025\/03\/Tignis-Logo-cohu-tagline-all-white-transparent-1500x444.png 1500w, \/wp-content\/uploads\/2025\/03\/Tignis-Logo-cohu-tagline-all-white-transparent-705x209.png 705w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><\/div><\/div><\/div><\/div>\n<\/div><\/div><\/main><!-- close content main element --><\/div><\/div><\/div><div id='after_section_1'  class='main_color av_default_container_wrap container_wrap fullsize'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-full alpha units'><div class='post-entry post-entry-type-page post-entry-47819'><div class='entry-content-wrapper clearfix'>\n<div  class='flex_column av-vy1v15-87391fb579ef2232f8ee8985e586388c av_one_full  avia-builder-el-5  el_after_av_section  el_before_av_hr  avia-builder-el-first  first flex_column_div  '     ><style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m8gamj24-08643594e48e0f4b1ac50aad43c574bb\">\n#top .av_textblock_section.av-m8gamj24-08643594e48e0f4b1ac50aad43c574bb .avia_textblock{\nfont-size:40px;\n}\n<\/style>\n<section  class='av_textblock_section av-m8gamj24-08643594e48e0f4b1ac50aad43c574bb '   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><div id=\"title\" class=\"style-scope ytd-watch-metadata\">\n<p class=\"style-scope ytd-watch-metadata\" style=\"text-align: center;\"><strong>Using AI For Fault Detection And Classification In Semiconductor Manufacturing<\/strong><\/p>\n<\/div>\n<div id=\"top-row\" class=\"style-scope ytd-watch-metadata\">\n<div id=\"owner\" class=\"item style-scope ytd-watch-metadata\"><\/div>\n<\/div>\n<\/div><\/section><br \/>\n<div  class='av-post-metadata-container av-m8j75jxs-db831c992b22256986099294efdf6686 av-metadata-container-align-center  avia-builder-el-7  el_after_av_textblock  avia-builder-el-last  av-metadata-container-1'><div class='av-post-metadata-container-inner'><span class=\"av-post-metadata-content av-post-metadata-meta-content\"><span class=\"av-post-metadata-content av-post-metadata-published\"><span class=\"av-post-metadata-published-date\" >5. September 2025<\/span><\/span><span class=\"av-post-metadata-content av-post-metadata-separator\">\/<\/span><span class=\"av-post-metadata-content av-post-metadata-category\"><span class=\"av-metadata-before av-metadata-before-categories\">in<\/span><span class=\"av-post-metadata-category-link\" ><a href=\"https:\/\/www.cohu.com\/category\/thought-leadership\/\" >Thought Leadership<\/a><\/span><\/span><\/span><\/div><\/div><\/p><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-1bv7v3t-a95a3fe20eb3c9b5d76211f468174fcf\">\n#top .hr.hr-invisible.av-1bv7v3t-a95a3fe20eb3c9b5d76211f468174fcf{\nheight:50px;\n}\n<\/style>\n<div  class='hr av-1bv7v3t-a95a3fe20eb3c9b5d76211f468174fcf hr-invisible  avia-builder-el-8  el_after_av_one_full  el_before_av_image '><span class='hr-inner '><span class=\"hr-inner-style\"><\/span><\/span><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m8g2cr45-7f13fca36e716ff164d97cdf3b8c446d\">\n.avia-image-container.av-m8g2cr45-7f13fca36e716ff164d97cdf3b8c446d img.avia_image{\nbox-shadow:none;\n}\n.avia-image-container.av-m8g2cr45-7f13fca36e716ff164d97cdf3b8c446d .av-image-caption-overlay-center{\ncolor:#ffffff;\n}\n<\/style>\n<div  class='avia-image-container av-m8g2cr45-7f13fca36e716ff164d97cdf3b8c446d av-styling- avia-align-center  avia-builder-el-9  el_after_av_hr  el_before_av_hr '   itemprop=\"image\" itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/ImageObject\" ><div class=\"avia-image-container-inner\"><div class=\"avia-image-overlay-wrap\"><img decoding=\"async\" fetchpriority=\"high\" class='wp-image-47821 avia-img-lazy-loading-not-47821 avia_image ' src=\"\/wp-content\/uploads\/2025\/09\/Jon-H-video-3-thumbnail-1030x576.png\" alt='' title='Jon H - video 3 thumbnail'  height=\"576\" width=\"1030\"  itemprop=\"thumbnailUrl\" srcset=\"\/wp-content\/uploads\/2025\/09\/Jon-H-video-3-thumbnail-1030x576.png 1030w, \/wp-content\/uploads\/2025\/09\/Jon-H-video-3-thumbnail-300x168.png 300w, \/wp-content\/uploads\/2025\/09\/Jon-H-video-3-thumbnail-768x430.png 768w, \/wp-content\/uploads\/2025\/09\/Jon-H-video-3-thumbnail-705x395.png 705w, \/wp-content\/uploads\/2025\/09\/Jon-H-video-3-thumbnail.png 1315w\" sizes=\"(max-width: 1030px) 100vw, 1030px\" \/><\/div><\/div><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lbiuux-3a749e977cbb88a05299ca7ae31228f5\">\n#top .hr.hr-invisible.av-lbiuux-3a749e977cbb88a05299ca7ae31228f5{\nheight:50px;\n}\n<\/style>\n<div  class='hr av-lbiuux-3a749e977cbb88a05299ca7ae31228f5 hr-invisible  avia-builder-el-10  el_after_av_image  el_before_av_one_full '><span class='hr-inner '><span class=\"hr-inner-style\"><\/span><\/span><\/div>\n<div  class='flex_column av-tuqj09-3cc37ce1123cba055c8eb4140e4e2149 av_one_full  avia-builder-el-11  el_after_av_hr  el_before_av_codeblock  first flex_column_div  '     ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m8g2fmrk-8b9f652136afad41086947b64f0762b7\">\n#top .hr.hr-invisible.av-m8g2fmrk-8b9f652136afad41086947b64f0762b7{\nheight:50px;\n}\n<\/style>\n<div  class='hr av-m8g2fmrk-8b9f652136afad41086947b64f0762b7 hr-invisible  avia-builder-el-12  el_before_av_textblock  avia-builder-el-first '><span class='hr-inner '><span class=\"hr-inner-style\"><\/span><\/span><\/div><br \/>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m8g2eekt-b107f7410796bb625fa647253b1d1667\">\n#top .av_textblock_section.av-m8g2eekt-b107f7410796bb625fa647253b1d1667 .avia_textblock{\nfont-size:18px;\n}\n<\/style>\n<section  class='av_textblock_section av-m8g2eekt-b107f7410796bb625fa647253b1d1667 '   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><section class=\"elementor-section elementor-top-section elementor-element elementor-element-016cded elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"016cded\" data-element_type=\"section\" data-settings=\"{\">\n<div class=\"elementor-container elementor-column-gap-default\">\n<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-3545ea9\" data-id=\"3545ea9\" data-element_type=\"column\">\n<div class=\"elementor-widget-wrap elementor-element-populated\">\n<div class=\"elementor-element elementor-element-b8cc7f6 elementor-widget elementor-widget-text-editor\" data-id=\"b8cc7f6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n<div class=\"elementor-widget-container\">\n<p>Classic fault detection and classification has some classic problems. It&#8217;s reactive, time-consuming to set up, and any product change involves significant man-hours. Even then, it still misses a lot of problems, which result in scrap. This is where machine learning can excel, because it can sift through huge amounts of data from thousands of sensors and find outliers and patterns. But there&#8217;s a big difference between supervised FDC and unsupervised. Jon Herlocker, VP &amp; General Manager of Tignis, A Cohu Analytics Solution, talks with Semiconductor Engineering about the limitations of supervised FDC, which relies on previous faults, and why unsupervised FDC is necessary to reduce scrap and predict where failures will occur. [This is the third part in a seven-part series on AI in manufacturing.]<\/p>\n<\/div>\n<div class=\"elementor-widget-container\"><\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<\/div><\/section><\/p><\/div>\n\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":67,"featured_media":47821,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":"","_links_to":"","_links_to_target":""},"categories":[413],"tags":[],"class_list":["post-47819","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-thought-leadership"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.7 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Using AI For Fault Detection And Classification In Semiconductor Manufacturing | cohu.com<\/title>\n<meta name=\"description\" content=\"Classic fault detection and classification has some classic problems. 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